Electron Microscopy Service

Herschel Building

In our microscopy section we have five electron microscopes providing a range of analytical techniques. Three instruments are fitted with EDX light element analysers to detect and quantify elements from Beryllium upwards. Results can be provided as distibution maps as well as area averaged and spot analysis. Images are provided in various digital formats from about 20 times up to 300 000 times magnification. Imaging modes include secondary electron emission, backscattered electron and cathodoluminescence.
Two of the instruments can be run in low vacuum mode for sensitive samples or those that cannot be coated with carbon or gold.

The latest technique to be added is EBSD which can be found on our latest machine the FEI ESEM.

The instrument seen to the right is an Hitachi S2400 Scanning Electron Microscope fitted with an Oxford Instruments Isis 200 Ultra Thin Window X-ray detector. It is normally used to take images in the magnification range of 20x to over 50 000x using it's secondary or backscattered electron modes. It is also fitted with a cathodoluminescence detector. The x-ray analyser attached to the column can perform qualitative and quantitative functions and produce output in the form of numbers, graphs, maps and images.

Another two microscopes are JEOL 5300's one of which is a low vacuum JSM5300LV intended for observing and analysing specimens that have not been coated with the traditional carbon or gold layer.

Another Hitachi SEM is available for 'hands on' observation of specimens.

For booking or enquiries Tel (0191) 222 7058

or email acma@ncl.ac.uk

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