Enhancing the signal-to-noise ratio of X-ray diffraction profiles by smoothed principal component analysis (2005)

Author(s): Chen ZP, Morris J, Martin E, Hammond RB, Lai X, Ma C, Purba E, Roberts KJ, Bytheway R

      • Journal: Analytical Chemistry
      • Volume: 77
      • Issue: 20
      • Pages: 6563-6570
      • Publisher: American Chemical Society
      • Publication type: Article
      • Bibliographic status: Published

      Emeritus Professor Julian Morris
      Technical Director Centre for Process Analytics and Control Technology (CPACT)