Publication

Assessment of strained silicon/SiGe with different architectures by Raman spectroscopy (2005)

Author(s): Bull SJ, Dobrosz P, Olsen SH, O'Neill AG

      • Date: 22-24 June 2005
      • Conference Name: Proceedings of Electronic Materials Conference
      • Publication type: Conference Proceedings (inc. abstract)
      • Bibliographic status: Published
        Staff

        Professor Anthony O'Neill
        Siemens Professor of Microelectronics

        Dr Sarah Olsen
        Senior Lecturer