Publication

Prediction of boron transient enhanced diffusion through the atom-by-atom modeling of extended defects (2003)

Author(s): Cowern NEB; Lampin E; Cristiano F; Lamrani Y; Claverie A; Colombeau B

      • Date: 23-09-2003
      • Journal: Journal of Applied Physics
      • Volume: 94
      • Issue: 12
      • Pages: 7520-7525
      • Publisher: American Institute of Physics
      • Publication type: Article
      • Bibliographic status: Published
      Staff

      Professor Nick Cowern
      Professor of Nanoscience / Nanotechnology