Publication

DFT analysis of the indium-antimony-vacancy cluster in silicon (2005)

Author(s): De Souza MM; Goss J

      • Journal: Defects and Diffusion Forum
      • Volume: 245-246
      • Pages: 29–38
      • Publisher: Scitec Publications Ltd.
      • Publication type: Article
      • Bibliographic status: Published
        Staff

        Dr Jonathan Goss
        Lecturer