Publication

Evaluation of GaAs Schottky gate bipolar transistor (SGBT) by electrothermal simulation (2000)

Author(s): Wright NG; O'Neill AG; Hossin M; Johnson CM

      • Journal: Solid-State Electronics
      • Volume: 44
      • Issue: 1
      • Pages: 85-94
      • Publisher: Elsevier Science Ltd
      • Publication type: Article
      • Bibliographic status: Published
      Staff

      Professor Anthony O'Neill
      Siemens Professor of Microelectronics

      Professor Nick Wright
      Pro-Vice-Chancellor