Newcastle University

Publication

Quantifying Self-Heating Effects in Strained Si MOSFETs with Scaling (2006)

Author(s): Agaiby R; O'Neill AG; Olsen SH; Eneman G; Verheyen P; Loo R; Claeys C

• Date: 19-21 September 2006
• Conference Name: Proceeding of the 36th European Solid-State Device Research Conference (ESSDERC)
• Pages: 97-100
• Publisher: IEEE
• Publication type: Conference Proceedings (inc. abstract)
• Bibliographic status: Published

• URL: http://dx.doi.org/10.1109/ESSDER.2006.307647
• DOI: 10.1109/ESSDER.2006.307647