Publication

E-BIST: Enhanced test-per-clock BIST architecture (2002)

Author(s): Russell G; Son Y; Chong J

      • Journal: IEE Proceedings: Computers and Digital Techniques
      • Volume: 149
      • Issue: 1
      • Pages: 9-15
      • Publisher: IEEE
      • Publication type: Article
      • Bibliographic status: Published
      Staff

      Dr Gordon Russell
      Guest Member of Staff
      • Telephone: +44 (0) 191 222 7324