Publication

The NNO defect in silicon (1995)

Author(s): F. Berg Rasmussen, S. Öberg, R. Jones, C. Ewels, J. Goss, J. Miro and P. Deák

  • : The NNO defect in silicon
  • Short Title: The NNO defect in silicon
  • Conference Name: ICDS-18 - Proceedings of the 18th International Conference on Defects in Semiconductors, Pts 1-4
  • Volume: 196-
  • Pages: 791-795
  • Publication type: Conference Proceedings (inc. abstract)
  • Bibliographic status: Published
    Staff

    Dr Jonathan Goss
    Lecturer