Electron energy loss spectroscopy of extended defects (2004)

Author(s): Bangert U, Gutierrez-Sosa A, Harvey A, Jones R, Fall CJ, Blumenau A, Briddon R

      • Conference Name: Institute of Physics Conference Series: Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference
      • Volume: 179
      • Pages: 17-22
      • Publisher: Institute of Physics Publishing Ltd.
      • Publication type: Conference Proceedings (inc. abstract)
      • Bibliographic status: Published

        Professor Patrick Briddon
        Professor of Computational Physics