Publication

Mobility-limiting mechanisms in single and dual channel strained Si/SiGe MOSFETs (2005)

Author(s): Olsen SH, Dobrosz P, Escobedo-Cousin E, Bull SJ, O'Neill AG

      • Conference Name: EMRS 2005, Symposium D: Materials Science and Device Issues for Future Technologies
      • Volume: 124-125
      • Pages: 107-112
      • Publisher: Materials Science and Engineering B: Solid-State Materials for Advanced Technology: Elsevier
      • Publication type: Conference Proceedings (inc. abstract)
      • Bibliographic status: Published
      Staff

      Professor Anthony O'Neill
      Siemens Professor of Microelectronics

      Dr Sarah Olsen
      Senior Lecturer