Publication

One-way randomised Radon mapping for appearance-based biometric authentication (2008)

Author(s): Dabbah MA, Woo WL, Dlay SS

      • Date: 29 July - 1 August 2008
      • Conference Name: 5th International Conference on Visual Information Engineering (VIE 2008)
      • Pages: 276-281
      • Publisher: Institution of Engineering and Technology (IET)
      • Publication type: Conference Proceedings (inc. abstract)
      • Bibliographic status: Published
        Staff

        Dr Wai Lok Woo
        Director of Singapore Operations