Publication

Investigation of Strain Profile Optimization in gate-all-around suspended silicon nanowire FET (2008)

Author(s): Najmzadeh M; Moselund K; Ionescu A; Dobrosz P; Olsen S; O'Neill AG

      • Date: 15-19 September 2008
      • Conference Name: 38th European Solid State Device Research Conference (ESSDERC 2008)
      • Publication type: Conference Proceedings (inc. abstract)
      • Bibliographic status: Published
        Staff

        Professor Anthony O'Neill
        Siemens Professor of Microelectronics