Publication

Theoretical investigations of the diffusion of Nitrogen-pair defects in Silicon (2005)

Author(s): Fujita N, Jones R, Goss JP, Frauenheim T, Oberg S, Briddon PR

      • Conference Name: Diffusion and Defect Data Pt.B: Solid State Phenomena. 11th International Autumn Meeting on Gettering and Defect Engineering in Semiconductor Technlogy
      • Volume: 108-109
      • Pages: 407-412
      • Publisher: Scitec Publications Ltd.
      • Publication type: Conference Proceedings (inc. abstract)
      • Bibliographic status: Published
        Staff

        Dr Jonathan Goss
        Lecturer