Publication

Modelling of strained-Si/SiGe NMOS transistors including DC self-heating (2006)

Author(s): Jankovic ND, Pesic TV, O'Neill A

      • Journal: Solid-State Electronics
      • Volume: 50
      • Issue: 3
      • Pages: 496-499
      • Publisher: Pergamon
      • Publication type: Article
      • Bibliographic status: Published
      Staff

      Professor Anthony O'Neill
      Siemens Professor of Microelectronics