Publication

Vacancy-type defects in TiO2/SiO2/SiC dielectric stacks (2007)

Author(s): Coleman PG, Burrows CP, Mahapatra R, Wright NG

      • Journal: Journal of Applied Physics
      • Volume: 102
      • Issue: 1
      • Pages: 014106
      • Publisher: American Institute of Physics
      • Publication type: Article
      • Bibliographic status: Published
      Staff

      Professor Nick Wright
      Pro-Vice-Chancellor