Publication

Analysis of self-heating effects in ultrathin-body SOI MOSFETs by device simulation (2008)

Author(s): Fiegna C; Yang Y; Sangiorgi E; O'Neill AG

      • Journal: IEEE Transactions on Electron Devices
      • Volume: 55
      • Issue: 1
      • Pages: 233-244
      • Publisher: IEEE
      • Publication type: Article
      • Bibliographic status: Published
      Staff

      Professor Anthony O'Neill
      Siemens Professor of Microelectronics