Publication
Analysis of self-heating effects in ultrathin-body SOI MOSFETs by device simulation (2008)
Author(s): Fiegna C; Yang Y; Sangiorgi E; O'Neill AG
- Journal: IEEE Transactions on Electron Devices
- Volume: 55
- Issue: 1
- Pages: 233-244
- Publisher: IEEE
- Publication type: Article
- Bibliographic status: Published