Newcastle University

Publication

Analysis of a passive sensor for predicting process-induced stress in advanced integrated circuit interconnect (2008)

Author(s): Gallacher B, O'Neill A, Bull S, Wilson C, Horsfall A

• Journal: IEEE Transactions on Device and Materials Reliability
• Volume: 8
• Issue: 1
• Pages: 174-181
• Publisher: IEEE
• Publication type: Article
• Bibliographic status: Published

• URL: http://dx.doi.org/10.1109/TDMR.2007.912272
• DOI: 10.1109/TDMR.2007.912272
• ISSN (electronic): 1558-2574

Staff

Professor Anthony O'Neill Siemens Professor of Microelectronics

Email: anthony.oneill@ncl.ac.uk Telephone: +44 (0) 191 222 7328