Publication:
Integration of analystic techniques in stochastic optimization of microsystem reliability (2011)
Author(s): Xue X, Bailey C, Lu H, Stoyanov S
- Date: 12-02-2011
- Journal: Microelectronics Reliability
- Volume: 51
- Issue: 5
- Pages: 936-945
- Publisher: Pergamon
- Publication type: Article
- Bibliographic status: Published