Publication:

Integration of analystic techniques in stochastic optimization of microsystem reliability (2011)

Author(s): Xue X, Bailey C, Lu H, Stoyanov S

      • Date: 12-02-2011
      • Journal: Microelectronics Reliability
      • Volume: 51
      • Issue: 5
      • Pages: 936-945
      • Publisher: Pergamon
      • Publication type: Article
      • Bibliographic status: Published
      Staff

      Dr Xiangdong Xue