Publication:
Defect classification using a new feature for pulsed eddy current sensors (2005)
Author(s): Tian GY, Sophian A
- Date: 05-08-2004
- Journal: NDT & E International
- Volume: 38
- Issue: 1
- Pages: 77-82
- Publisher: Elsevier Ltd
- Publication type: Article
- Bibliographic status: Published