Publication:

Defect classification using a new feature for pulsed eddy current sensors (2005)

Author(s): Tian GY, Sophian A

      • Date: 05-08-2004
      • Journal: NDT & E International
      • Volume: 38
      • Issue: 1
      • Pages: 77-82
      • Publisher: Elsevier Ltd
      • Publication type: Article
      • Bibliographic status: Published