Newcastle University

Publication:

The Thickogram: a method for easy film-thickness measurement in XPS (2000)

Author(s): Cumpson PJ

• Date: 01-06-2000
• Journal: Surface and Interface Analysis
• Volume: 29
• Issue: 6
• Pages: 403-406
• Publisher: John Wiley & Sons
• Publication type: Article
• Bibliographic status: Published

• URL: http://dx.doi.org/10.1002/1096-9918(200006)29:6<403::AID-SIA884>3.0.CO;2-8
• DOI: 10.1002/1096-9918(200006)29:6<403::AID-SIA884>3.0.CO;2-8
• ISSN (electronic): 1096-9918

Staff

Professor Peter Cumpson Science City Prof in MEMS

Email: peter.cumpson@ncl.ac.uk Telephone: +44 (0) 191 222 7911