Elastic-Scattering Corrections in AES and XPS 2: Estimating Attenuation Lengths and Conditions Required for their Valid Use in Overlayer/Substrate Experiments (1997)

Author(s): Cumpson, P.J. and Seah, M.P.

      • Journal: Surface and Interface Analysis
      • Volume: 25
      • Pages: 430
      • Publication type: Article
      • Bibliographic status: Published

        Professor Peter Cumpson
        Science City Prof in MEMS