Publication:

Angle-Resolved XPS and AES: Depth-resolution Limits and a General Comparison of Properties of Depth-Profile Reconstruction Methods (1995)

Author(s): Cumpson, P.J.

      • Journal: Journal of Electron Spectroscopy
      • Volume: 73
      • Pages: 25
      • Publication type: Article
      • Bibliographic status: Published
        Staff

        Professor Peter Cumpson
        Science City Prof in MEMS