Accurate analytical measurements in the atomic force microscope: A microfabricated spring constant standard potentially traceable to the SI (2003)

Author(s): Cumpson PJ, Hedley J

      • Journal: Nanotechnology
      • Volume: 14
      • Issue: 12
      • Pages: 1279-1288
      • Publisher: Institute of Physics Publishing
      • Publication type: Article
      • Bibliographic status: Published

      Professor Peter Cumpson
      Science City Prof in MEMS

      Dr John Hedley
      Senior Lecturer