Publication:
Accurate analytical measurements in the atomic force microscope: A microfabricated spring constant standard potentially traceable to the SI (2003)
Author(s): Cumpson PJ, Hedley J
- Journal: Nanotechnology
- Volume: 14
- Issue: 12
- Pages: 1279-1288
- Publisher: Institute of Physics Publishing
- Publication type: Article
- Bibliographic status: Published