Publication:
Quantitative analytical atomic force microscopy: A cantilever reference device for easy and accurate AFM spring-constant calibration (2004)
Author(s): Cumpson PJ, Clifford CA, Hedley J
- Journal: Measurement Science and Technology
- Volume: 15
- Issue: 7
- Pages: 1337-1346
- Publisher: Institute of Physics Publishing Ltd
- Publication type: Article
- Bibliographic status: Published