Quantitative analytical atomic force microscopy: A cantilever reference device for easy and accurate AFM spring-constant calibration (2004)

Author(s): Cumpson PJ, Clifford CA, Hedley J

      • Journal: Measurement Science and Technology
      • Volume: 15
      • Issue: 7
      • Pages: 1337-1346
      • Publisher: Institute of Physics Publishing Ltd
      • Publication type: Article
      • Bibliographic status: Published

      Professor Peter Cumpson
      Science City Prof in MEMS