Newcastle University

Projects

• An EPSRC National Facility for X-ray Photoelectron Spectroscopy
  Project Leader(s): Professor Peter Cumpson
  

  EPSRC has named Newcastle University as the UK provider of the National X-ray Photoelectron Spectroscopy (XPS) service.  The service, NEXUS, is hosted by the University's nanoLAB research centre...

• Atomic Layer Interface Engineering for Nanoelectronics (ALIEN)
  Project Leader(s): Professor AG O'Neill (EECE)
• Development of next generation immunoassay diagnostics
  Project Leader(s): Dr EH Yu (CEAM)
• Early stage diagnostic technology
  Project Leader(s): Professor Peter Cumpson
• Platinum Drug Measurement Instrument for Chemotherapy Management
  Project Leader(s): Prof Peter Cumpson
• Xray Photon Spectroscopy
  Project Leader(s): Professor Peter Cumpson

• Escobedo-Cousin E, Vassilevski K, Hopf T, Wright N, O'Neill A, Horsfall A, Goss J, Cumpson PJ. Local solid phase growth of few-layer graphene on silicon carbide from nickel silicide supersaturated with carbon. Journal of Applied Physics 2013, 113(11), 114309.
• Cumpson PJ, Portoles JF, Sano N. Material dependence of argon cluster ion sputter yield in polymers: Method and measurements of relative sputter yields for 19 polymers . Journal of Vacuum Science and Technology A 2013, 31(2), 020605.
• Cumpson PJ, Portoles JF, Sano N. Observations on X-ray enhanced sputter rates in argon cluster ion sputter depth profiling of polymers. Surface and Interface Analysis 2013, 45(2), 601-604.
• Escobedo-Cousin E, Vassilevski K, Hopf T, Wright N, O'Neill A, Horsfall A, Goss J, Cumpson P. Optimising the Growth of Few-Layer Graphene on Silicone Carbide by Nickel Silicidation. Materials Science Forum 2013, 740-742, 121-124.
• Cumpson PJ, Sano N. Stability of reference masses V: UV/ozone treatment of gold and platinum surfaces. Metrologia 2013, 50(1), 27-36.
• Cumpson PJ, Portoles JF, Sano N, Barlow AJ. X-ray enhanced sputter rates in argon cluster ion sputter-depth profiling of polymers. Journal of Vacuum Science and Technology B 2013, 31(2), 021208.
• Aitken RJ, Garrod J, Hankin SM, Lang Tran C, Donaldson K, Stone V, Cumpson P, Johnstone J, Cash S. A multidisciplinary approach to the identification of reference materials for engineered nanoparticle toxicology. Nanotoxicology 2008, 2(2), 71-78.
• Munz M, Cox DC, Cumpson PJ. Nano-scale shear mode testing of the adhesion of nanoparticles to a surface-support. Physica Status Solidi A: Applications and Materials Science 2008, 205(6), 1424-1428.
• Roy D, Munz M, Colombi P, Bhattacharyya S, Salvetat J-P, Cumpson PJ, Saboungi M-L. Directly writing with nanoparticles at the nanoscale using dip-pen nanolithography. Applied Surface Science 2007, 254(5), 1394-1398.
• Wang J, Cumpson PJ. Modelling of angle-resolved X-ray photoelectron spectroscopy (ARXPS) intensity ratios for nanocharacterisation of closely packed shell-core nanofibres. In: Instrumentation, Metrology, and Standards for Nanomanufacturing. 2007, San Diego, California, USA: International Society for Optical Engineering.
• Tantra R, Cumpson P. The detection of airborne carbon nanotubes in relation to toxicology and workplace safety. Nanotoxicology 2007, 1(4), 251-265.
• Portoles JF, Cumpson PJ, Hedley J, Allen S, Williams PM, Tendler SJB. Accurate velocity measurements of AFM-cantilever vibrations by Doppler interferometry. Journal of Experimental Nanoscience 2006, 1(1), 51-62.
• Sheridan B, Cumpson P, Bailey M. Metrology at the nano scale. Physics World 2005, 18(8), 37-40.
• Cumpson PJ, Hedley J, Clifford CA. Microelectromechanical device for lateral force calibration in the atomic force microscope: Lateral electrical nanobalance. Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures 2005, 23(5), 1992-1997.
• Cumpson PJ, Zhdan P, Hedley J. Calibration of AFM cantilever stiffness: A microfabricated array of reflective springs. Ultramicroscopy 2004, 100(3-4), 241-251.
• Cumpson PJ, Hedley J, Clifford CA, Chen XY, Allen S. Microelectromechanical system device for calibration of atomic force microscope cantilever spring constants, between 0.01 and 4 N/m. In: Journal of Vacuum Science & Technology A: 50th AVS International Symposium. 2004, Baltimore, Maryland, USA: American Institute of Physics.
• Cumpson PJ, Clifford CA, Hedley J. Quantitative analytical atomic force microscopy: A cantilever reference device for easy and accurate AFM spring-constant calibration. Measurement Science and Technology 2004, 15(7), 1337-1346.
• Cumpson PJ, Hedley J. Accurate analytical measurements in the atomic force microscope: A microfabricated spring constant standard potentially traceable to the SI. Nanotechnology 2003, 14(12), 1279-1288.
• Cumpson PJ, Hedley J, Zhdan P. Accurate force measurement in the atomic force microscope: A microfabricated array of reference springs for easy cantilever calibration. Nanotechnology 2003, 14(8), 918-924.
• Cumpson PJ. Angle-Resolved X-ray Photoelectron Spectroscopy. In: Briggs, D., Grant, J.T, ed. Surface Analysis by Auger and X-ray Photoelectron Spectroscopy. Chichester, UK: IM Publications, 2003.
• Cumpson PJ. Estimation of inelastic mean free paths for polymers and other organic materials - use of quantitative structure-property relationships. Surface and Interface Analysis 2001, 31(1), 23-34.
• Cumpson PJ. The Thickogram: a method for easy film-thickness measurement in XPS. Surface and Interface Analysis 2000, 29(6), 403-406.
• Cumpson, P.J. and Seah, M.P. Elastic-Scattering Corrections in AES and XPS 2: Estimating Attenuation Lengths and Conditions Required for their Valid Use in Overlayer/Substrate Experiments. Surface and Interface Analysis 1997, 25, 430.
• Cumpson, P.J. Angle-Resolved XPS and AES: Depth-resolution Limits and a General Comparison of Properties of Depth-Profile Reconstruction Methods. Journal of Electron Spectroscopy 1995, 73, 25.
• Cumpson, P.J. Elastic-Scattering Corrections in AES and XPS 1: Two Rapid Monte-Carlo Methods for Calculating the Depth-Distribution Function. Surface and Interface Analysis 1993, 20, 727.
• Cumpson, P.J. and Seah, M.P. The Quartz-Crystal Microbalance: Radial-Polar Dependence of Mass Sensitivity both On and Off the Electrodes. Measurement Science and Technology 1990, 1, 544.