Publication:
Capacitance-voltage (C-V) technique for the characterisation of stained Si/Si1-xGex hetero-structure MOS devices (2006)
Author(s): Chattopadhyay S, Varzgar JB, Seger J, Tsang YL, Kwa KSK, Olsen SH, O'Neill AG
- Date: 4-6 January 2006
- Conference Name: EMPDS (Electronic and Photonic Materials, Devices and Systems)
- Publication type: Conference Proceedings (inc. abstract)
- Bibliographic status: Unknown