Publication:
Linearity and mobility degradation in strained Si MOSFETs with thin gate dielectrics (2010)
Author(s): Alatise OM, Olsen SH, O'Neill AG
- Date: 25-01-2010
- Journal: Solid State Electronics
- Volume: 54
- Issue: 6
- Pages: 628-634
- Publisher: Pergamon
- Publication type: Article
- Bibliographic status: Published