Publication:

The Thickogram: a method for easy film-thickness measurement in XPS (2000)

Author(s): Cumpson PJ

      • Date: 01-06-2000
      • Journal: Surface and Interface Analysis
      • Volume: 29
      • Issue: 6
      • Pages: 403-406
      • Publisher: John Wiley & Sons
      • Publication type: Article
      • Bibliographic status: Published
      Staff

      Professor Peter Cumpson
      Science City Prof in MEMS