Publication:

The use of Raman spectroscopy to identify strain and strain relaxation in strained Si/SiGe structures (2005)

Author(s): Dobrosz P, Bull SJ, Olsen SH, O'Neill AG

      • Journal: Surface and Coatings Technology
      • Volume: 200
      • Issue: 5-6
      • Pages: 1755-1760
      • Publisher: Elsevier
      • Publication type: Article
      • Bibliographic status: Published
      Staff

      Professor Steve Bull
      Cookson Group Chair of Eng Materials

      Professor Anthony O'Neill
      Siemens Professor of Microelectronics

      Dr Sarah Olsen
      Senior Lecturer