Publication:

Strained Si/strained SiGe/relaxed SiGe structures: identifying roughness due to compressed SiGe and its impact on high mobility MOSFETs (2007)

Author(s): Escobedo-Cousin E, Olsen SH, O'Neill AG, Alatise OM, Agaiby RMB, Dobrosz P, Braithwaite G, Cuthbertson A, Grasby T, Parker EHC

      • Date: 9-13 April 2007
      • Conference Name: Materials REsearch Society Conference (MRS)
      • Publication type: Conference Proceedings (inc. abstract)
      • Bibliographic status: Unknown
        Staff

        Dr Enrique Escobedo-Cousin
        Research Associate

        Professor Anthony O'Neill
        Siemens Professor of Microelectronics

        Dr Sarah Olsen
        Senior Lecturer