Surface Characterisation Day 2012
nanoLAB are pleased to announce the inaugural Surface Characterisation Day to be held in the Research Beehive, Old Library Building, Newcastle University on Monday 16th January 2012.
Joint between Newcastle, Durham and Northumbria Universities, and sponored by Nanoscale - a high-impact journal from the RSC spanning nanoscience and nanotechnology- the day is aimed at increasing awareness of the facilities available in the North-East, particularly XPS, SIMS and electron microscopy and to demonstrate the breadth of experiments which are possible.
We have a number of excellent speakers (see schedule below) and there will also be a poster session during the lunchtime break as well as tours of the XPS facilities available here in Newcastle.
Registration (including lunch) is completely FREE so to register to attend please complete the short Surface Characterisation Day Registration Form. The meeting is open to students, researchers and academics at all three universities.
Schedule:
10.30am |
Registration and Coffee |
11.00am |
Welcome and Introductions |
11.15am |
Use of XPS to characterise the functionalisation of carbon nanotubes Michael Hunt, Durham University |
11.45pm |
The use of secondary ion mass spectroscopy in thin film solar cells Guillaume Zoppi, Northumbria University |
12.15pm |
Characterisation of silver nanoparticles in complex media Lidija Siller, Newcastle University |
12.45pm |
Lunch and Posters |
2.15pm |
Surface analysis in modern industry - more, faster, cheaper, better? Ian W. Fletcher, Intertek MSG |
3pm |
Application of electron microscopy in photovoltaic materials research Budhika Mendhis, Durham University |
3.30pm |
Tours of XPS Facilities |
4.30pm |
Close |