SEM (Hitachi)

Hitachi SEM

The Hitachi S2400 Scanning Electron Microscope (SEM) is a versatile workhorse of an SEM. It is fitted with an Oxford Instruments Inca ultra-thin window X-ray detector (an EDX detector).

It is normally used to take images in the magnification range of X30 to over X5 000 using its secondary electron (SEI) or backscattered electron (BSE) modes. It is also fitted with a cathodoluminescence (CL) detector.

The EDX detector attached to the column can perform qualitative and semi-quantitative element characterisation functions and produce output in the form of numeric tables, graphs, maps and images.

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