X-ray Powder Diffraction

XRPD is a robust technique used for the characterisation of crystalline materials, i.e. those which have a degree of order to their structure. By exposing a sample to an X-ray beam of known wavelength, a diffraction pattern unique to each crystalline phase within that sample material is generated and this pattern is used to identify and characterise each crystalline phase present.

X'Pert Pro MPD

Through interpretation of diffraction patterns, XRPD analysis allows:

  • identification of crystalline phases
  • measurement of crystallite/crystal domain size within discrete crystalline phases
  • calculation of unit cell dimensions through pattern indexing
  • phase quanitification using one of several methods

The PANalytical X'Pert Pro Multipurpose Diffractometer (MPD) is used for most of our X-ray powder diffraction (XRPD) analysis. It has various interchangeable attachments:

inside X'Pert

We also have a PW1730 X-ray generator with a sample spinner stage.

Although our XRPD lab is primarily a powder diffraction facility, we often carry out phase identification in thin film samples. Contact us if you are interested in thin film analysis - we will try to accommodate your analytical requests.

Complimentary to our XRPD lab is the School of Natural and Environmental Sciences Chemical Crystallography Service who have extensive expertise in structure determinations using single-crystal diffractometers.


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