School of Engineering

Microelectronic Characterisation

Microelectronic Characterisation Lab

In our climate controlled electrical and material characterisation laboratory, we can perform an extensive array of tests on semiconductor devices and structures.

The use of the Characterisation Lab is open to all staff of the University as well as PhD and project students (BEng, MEng and MSc). Charges might apply for use of equipment in the lab. 

Test capabilities include:

  • DC and RF 200mm probe stations for varied C-V and I-V analysis to 67GHz
  • low and high-frequency noise measurement
  • specialist facilities in electrical measurement for hostile environments
  • Atomic force microscopy
  • Raman
Characterisation Lab