Instruments

Demonstration of equipment

ORION NanoFab HIM

Ultra-high resolution imaging with great materials contrast and high depth-of-field, coupled with sub-10nm nanofabrication.

Zeiss Capella Ga FIB

Zeiss Capella Ga FIB

Gallium FIB for rapid milling of structures and sample preparation on a nanometric scale.

J105 Gothenburg

J105 ToF SIMS

3D chemical imaging with simultaneous high mass and high spatial resolution.