Faculty of Science, Agriculture & Engineering


NEXUS: Excellent Characterisation Supporting UK Research

NEXUS has a portfolio addressing our customers' needs that cannot be matched just by standard XPS analysis

This research includes:

  • optimising sputtering conditions for surface cleaning and organic depth-profiling
  • characterising the origins of X-ray damage in polymers under cluster ion beams
  • imaging grapheme and other 2D materials by novel multivariate XPS methods