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Ion Beams

These world-leading instruments can provide unprecedented detail.

These instruments are installed within a purpose built laboratory, with the HIM installed in a clean-room with atmospheric control and vibration isolation.

Co-located with our XPS facilities means we can provide a unique and powerful combination of nanometrology. This enables detailed characterisation of structures and devices produced by both top-down and bottom-up nanofabrication.

Individually these instruments are world-leading in their own right, but together they can provide an unprecedented level of understanding of the chemical, structural and topological makeup of materials, from soft biological materials such as plant, animal and human cells, to semiconductor and inorganic thin films, to nanomaterials such as graphene and nanotubes.

To help in the understanding of how these ion beam techniques can provide results for your research, we have identified two key application areas for the HIM and the ToF-SIMS:

  • Nanofabrication
  • Nanoscale & Molecular Characterisation

If you would like to have a discussion or enquire about use and project costs please contact us detailing your enquiry.

Instruments and equipment

Our staff

  • Professor Lidija Siller, Professor of Nanoscale Science
  • Jake Sheriff, Scientific Officer

Contact us

Our team is available to answer any questions you may have. They can also offer quotes for using our facilities, depending on your requirements.