Bowen Gu
Detecting faults in an insulated gate bipolar transistor.
Email: b.gu2@ncl.ac.uk
Supervisors
- Prof Volker Pickert
- Dr Mohamed Dahidah
- Dr Haimeng Wu
Project description
Press pack Insulated Gate Bipolar Transistors (PP IGBTs) are gaining more attention in HVDC power transmission systems. This is due to their high power density and high reliability compared with conventional power modules.
But the reliability of PP IGBTs is an issue. This is especially true for package level failure, which is different from the conventional power modules.
Condition monitoring of PP IGBTs is usually conducted by estimating the chip temperature. This is challenging.
This project focuses on a new parameter, deformation of the upper lid groove. This parameter can indicate the health condition of the PP IGBT based on its unique packaging technique.
Publications
- Condition monitoring of press-pack IGBT devices Using Deformation Detection Approach. 10th International Conference on Power Electronics, Machines and Drives (PEMD). 2020, UK: Nottingham. Paper submitted.
- Wu H, Gu B, Wang X, Pickert V, Ji B. Design and control of a bidirectional wireless charging system using GaN devices. In: 2019 IEEE Applied Power Electronics Conference and Exposition (APEC). 2019, Anaheim, California, USA: IEEE.
- Wu H, Wang X, Gu B, Pickert V. Investigation of a GaN-based Bidirectional Wireless Power Converter using resonant inductive coupling. In: IEEE MTT-S Wireless Power Transfer Conference (WPTC) (WPW 2019). 2019, London: IEEE.
Interests
Condition monitoring, thermal and mechanical analysis and reliability for the high voltage power devices.
Qualifications
- MSc in Automation and Control from Newcastle University (2017)